@article{Saxena_2012,
    doi = {10.1137/10848232},
    url = {https://doi.org/10.1137%2F10848232},
    year = {2012},
    month = {jan},
    publisher = {Society for Industrial {\&} Applied Mathematics ({SIAM})},
    volume = {41},
    number = {5},
    pages = {1285--1298},
    author = {Nitin Saxena and C. Seshadhri},
    title = {Blackbox Identity Testing for Bounded Top-Fanin Depth-3 Circuits: The Field Doesn{\textquotesingle}t Matter},
    journal = {{SIAM} Journal on Computing}
}

@article{Saxena_2012, doi = {10.1137/10848232}, url = {https://doi.org/10.1137%2F10848232}, year = {2012}, month = {jan}, publisher = {Society for Industrial {\&} Applied Mathematics ({SIAM})}, volume = {41}, number = {5}, pages = {1285--1298}, author = {Nitin Saxena and C. Seshadhri}, title = {Blackbox Identity Testing for Bounded Top-Fanin Depth-3 Circuits: The Field Doesn{\textquotesingle}t Matter}, journal = {{SIAM} Journal on Computing} }